Thermal-Aware Testing of Digital VLSI Circuits and SystemsPublisher: Taylor & Francis Ltd Year: 30/06/2020 ISBN: 9780367607098 Publication form: paperback
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Thermal-Aware Testing of Digital VLSI Circuits and SystemsPublisher: Taylor & Francis Inc Year: 25/04/2018 ISBN: 9780815378822 Publication form: hardback
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Network-on-Chip: The Next Generation of System-on-Chip IntegrationPublisher: Taylor & Francis Ltd Year: 26/07/2017 ISBN: 9781138749351 Publication form: paperback
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A Textbook of ElectronicsPublisher: The Info Library Year: 01/10/2020 ISBN: 9781642879292 Publication form: eBook: Fixed Page eTextbook (PDF)
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Thermal-Aware Testing of Digital VLSI Circuits and SystemsPublisher: Taylor & Francis Year: 24/04/2018 Edition: First ISBN: 9781351227766 Publication form: eBook: Reflowable eTextbook (ePub)
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Progress in VLSI Design and TestPublisher: Springer Nature Year: 26/06/2012 Edition: First ISBN: 9783642314940 Publication form: eBook: Fixed Page eTextbook (PDF)
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Network-on-Chip: The Next Generation of System-on-Chip IntegrationPublisher: Taylor & Francis Inc Year: 15/12/2014 ISBN: 9781466565265 Publication form: hardback
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Nutritional status & physical performance capacity of children: Nutrition and PerformancePublisher: LAP Lambert Academic Publishing ISBN: 9783659877520 Publication form: paperback
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Strategies to Reduce Power during VLSI Circuit Testing: Reduction of Dynamic and Leakage Power during Testing of Digital VLSI CircuitsPublisher: LAP Lambert Academic Publishing ISBN: 9783659255205 Publication form: paperback
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