ABE-IPSABE HOLDINGABE BOOKS
English Polski
Dostęp on-line

Książki

0.00 PLN
Schowek (0) 
Schowek jest pusty
Transmission Electron Microscopy, 4 Vol.: Basics; Diffraction; Imaging; Spectrometry

Transmission Electron Microscopy, 4 Vol.: Basics; Diffraction; Imaging; Spectrometry

Autorzy
Wydawnictwo Springer, Berlin
Data wydania 2009
Liczba stron 775
Forma publikacji książka w miękkiej oprawie
Język angielski
ISBN 9780387765020
Kategorie Testowanie materiałów
Zapytaj o ten produkt
E-mail
Pytanie
 
Do schowka

Opis książki

This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment.

Transmission Electron Microscopy, 4 Vol.: Basics; Diffraction; Imaging; Spectrometry

Spis treści

Basics.- The Transmission Electron Microscope.- Scattering and Diffraction.- Elastic Scattering.- Inelastic Scattering and Beam Damage.- Electron Sources.- Lenses, Apertures, and Resolution.- How to 'See' Electrons.- Pumps and Holders.- The Instrument.- Specimen Preparation.- Diffraction.- Diffraction in TEM.- Thinking in Reciprocal Space.- Diffracted Beams.- Bloch Waves.- Dispersion Surfaces.- Diffraction from Crystals.- Diffraction from Small Volumes.- Obtaining and Indexing Parallel-Beam Diffraction Patterns.- Kikuchi Diffraction.- Obtaining CBED Patterns.- Using Convergent-Beam Techniques.- Imaging.- Amplitude Contrast.- Phase-Contrast Images.- Thickness and Bending Effects.- Planar Defects.- Imaging Strain Fields.- Weak-Beam Dark-Field Microscopy.- High-Resolution TEM.- Other Imaging Techniques.- Image Simulation.- Processing and Quantifying Images.- Spectrometry.- X-ray Spectrometry.- X-ray Spectra and Images.- Qualitative X-ray Analysis and Imaging.- Quantitative X-ray Analysis.- Spatial Resolution and Minimum Detection.- Electron Energy-Loss Spectrometers and Filters.- Low-Loss and No-Loss Spectra and Images.- High Energy-Loss Spectra and Images.- Fine Structure and Finer Details.

Polecamy również książki

Strony www Białystok Warszawa
801 777 223