Wydawnictwo | Springer, Berlin |
Data wydania | |
Liczba stron | 522 |
Forma publikacji | książka w miękkiej oprawie |
Język | angielski |
ISBN | 9781441922090 |
Kategorie | Nanotechnologia |
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
Scanning Microscopy for Nanotechnology: Techniques and Applications