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Scanning Microscopy for Nanotechnology: Techniques and Applications

Scanning Microscopy for Nanotechnology: Techniques and Applications

Autorzy
Wydawnictwo Springer-Verlag New York Inc.
Data wydania 12/02/2010
Liczba stron 522
Forma publikacji książka w miękkiej oprawie
Poziom zaawansowania Dla profesjonalistów, specjalistów i badaczy naukowych
ISBN 9781441922090
Kategorie Pomiary i systemy miar, Nanotechnologia, Testowanie materiałów, Urządzenia i materiały elektroniczne
682.35 PLN (z VAT)
$175.46 / £145.41 / €157.00 /
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Przesyłka w 3-4 tygodnie
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Opis książki

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

Scanning Microscopy for Nanotechnology: Techniques and Applications

Spis treści

Fundamentals of Scanning Electron Microscopy (SEM).- Backscattering Detector and EBSD in Nanomaterials Characterization.- X-ray Microanalysis in Nanomaterials.- Low kV Scanning Electron Microscopy.- E-beam Nanolithography Integrated with Scanning Electron Microscope.- Scanning Transmission Electron Microscopy for Nanostructure Characterization.- to In-Situ Nanomanipulation for Nanomaterials Engineering.- Applications of FIB and DualBeam for Nanofabrication.- Nanowires and Carbon Nanotubes.- Photonic Crystals and Devices.- Nanoparticles and Colloidal Self-assembly.- Nano-building Blocks Fabricated through Templates.- One-dimensional Wurtzite Semiconducting Nanostructures.- Bio-inspired Nanomaterials.- Cryo-Temperature Stages in Nanostructural Research.

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