Optical properties, particularly in the infrared range of wavelengths,
continue to be of enormous interest to both material scientists and
device engineers. The need for the development of standards for data of
optical properties in the infrared range of wavelengths is very timely
considering the ongoing transition of nanotechnology from fundamental
R&D to manufacturing. Radiative properties play a critical role in
the processing, process control and manufacturing of semiconductor
materials, devices, circuits and systems. The design and implementation
of real-time process control methods in manufacturing requires the
knowledge of the radiative properties of materials. Sensors and imagers
operate on the basis of the radiative properties of materials. This book
reviews the optical properties of various semiconductors in the
infrared range of wavelengths. Theoretical and experimental studies of
the radiative properties of semiconductors are presented. Previous
studies, potential applications and future developments are outlined. In
Chapter 1, an introduction to the radiative properties is presented.
Examples of instrumentation for measurements of the radiative properties
is described in Chapter 2. In Chapters 3–11, case studies of the
radiative properties of several semiconductors are elucidated. The
modeling and applications of these properties are explained in Chapters
12 and 13, respectively. In Chapter 14, examples of the global
infrastructure for these measurements are illustrated.
Radiative Properties of Semiconductors