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Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists

Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists

Autorzy
Wydawnictwo Taylor & Francis
Data wydania 23/05/2022
Wydanie Pierwsze
Forma publikacji eBook: Reflowable eTextbook (ePub)
Język angielski
ISBN 9781000569902
Kategorie Nauka: zagadnienia ogólne, Fizyka ciał skondensowanych (fizyka ciał ciekłych i fizyka ciał stałych), Nauka o materiałach
licencja wieczysta
Produkt dostępny on-line
Typ przesyłki: wysyłka kodu na adres e-mail
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Opis książki

The structure–property relationship is a key topic in materials science and engineering. To understand why a material displays certain behaviors, the first step is to resolve its crystal structure and reveal its structure characteristics. Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists equips readers with an in-depth understanding of using powder x-ray diffraction and transmission electron microscopy for the analysis of crystal structures. Introduces fundamentals of crystallography Covers XRD of materials, including geometry and intensity of diffracted x-ray beams and experimental methods Describes TEM of materials and includes atomic scattering factors, electron diffraction, and diffraction and phase contrasts Discusses applications of HRTEM in materials research Explains concepts used in XRD and TEM lab training Based on the author’s course lecture notes, this text guides materials science and engineering students with minimal reliance on advanced mathematics. It will also appeal to a broad spectrum of readers, including researchers and professionals working in the disciplines of materials science and engineering, applied physics, and chemical engineering.

Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists

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