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Learning from VLSI Design Experience

Learning from VLSI Design Experience

Autorzy
Wydawnictwo Springer Nature
Data wydania 14/12/2018
Forma publikacji eBook: Reflowable eTextbook (ePub)
Język angielski
ISBN 9783030032388
Kategorie Inżynieria elektroniczna i komunikacyjna, Obwody i komponenty, Computer architecture & logic design
Produkt dostępny on-line
Typ przesyłki: wysyłka kodu na adres e-mail
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zamówienie z obowiązkiem zapłaty
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Opis książki

This book shares with readers practical design knowledge gained from the author’s 24 years of IC design experience. The author addresses issues and challenges faced commonly by IC designers, along with solutions and workarounds. Guidelines are described for tackling issues such as clock domain crossing, using lockup latch to cross clock domains during scan shift, implementation of scan chains across power domain, optimization methods to improve timing, how standard cell libraries can aid in synthesis optimization, BKM (best known method) for RTL coding, test compression, memory BIST, usage of signed Verilog for design requiring ve and -ve calculations, state machine, code coverage and much more. Numerous figures and examples are provided to aid the reader in understanding the issues and their workarounds.

Learning from VLSI Design Experience

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