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Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students.The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content.The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis.The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience.

Materials Characterization: Introduction to Microscopic and Spectroscopic Methods

LIGHT MICROSCOPYOptical PrinciplesInstrumentationSpecimen PreparationImaging ModesConfocal MicroscopyQuestionsX-RAY DIFFRACTION METHODSX-ray RadiationTheoretical Background of DiffractionX-ray DiffractometryWide Angle X-ray Diffraction and ScatteringQuestionsTRANSMISSION ELECTRON MICROSCOPYInstrumentationSpecimen PreparationImage ModesSelected Area DiffractionImages of Crystal DefectsQuestionsSCANNING ELECTRON MICROSCOPYInstrumentationContrast FormationOperational VariablesSpecimen PreparationQuestionsSCANNING PROBE MICROSCOPYInstrumentationScanning Tunneling MicroscopyAtomic Force MicroscopyImage ArtifactsQuestionsX-RAY SPECTROSCOPY FOR ELEMENTAL ANALYSISFeatures of Characteristic X-raysX-ray Fluorescence SpectrometryEnergy Dispersive Spectroscopy in Electron MicroscopesQualitative and Quantitative AnalysisQuestionsELECTRON SPECTROSCOPY FOR SURFACE ANALYSISBasic PrinciplesInstrumentationCharacteristics of Electron SpectraQualitative and Quantitative AnalysisQuestionsSECONDARY ION MASS SPECTROMETRY FOR SURFACE ANALYSISBasic PrinciplesInstrumentationSurface Structure AnalysisSIMS ImagingSIMS Depth ProfilingQuestionsVIBRATIONAL SPECTROSCOPY FOR MOLECULAR ANALYSISTheoretical BackgroundFourier Transform Infrared SpectroscopyRaman MicroscopyInterpretation of Vibrational SpectraQuestionsTHERMAL ANALYSISCommon CharacteristicsDifferential Thermal Analysis and Differential Scanning CalorimetryThermogravimetryQuestions